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Anil Jain

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Anil Jain

428 S. Shaw Lane
Engineering Building, Room 3143
East Lansing, MI 48824

Degree(s): 
Ph.D., Electrical Engineering, Ohio State University 1973
M.S., Electrical Engineering, Ohio State University 1970
B. Tech., Electrical Engineering, Indian Institute of Technology, Kanpur 1969
Biography: 

Anil Jain's research interests include pattern recognition, computer vision and biometric recognition. His articles on biometrics have appeared in Scientific American, Nature, IEEE Spectrum, Scholarpedia, and MIT Technology Review. He has received a number of awards, including Guggenheim fellowship, Humboldt Research award, Fulbright fellowship, IEEE Computer Society Technical Achievement award (2003), W. Wallace McDowell award (2007), IAPR King-Sun Fu Prize (2008), and ICDM 2008 Research Contribution Award. He holds six patents and is the author of several books.